

User can have the following options.
 1.  -l <file> 	:Log data to file. 
 2.  -c <num>	:Specify the card to be tested. 
 3.  -I <num>	:Iteration number
 4.  -t <id>	:Disable tests
 5.  -T <id>	:Enable tests
 6.  -r <num>   : Input radix
 7.  -lbm       : Option to specify number of packets in Mac Loopback test\n");
 8.  -lbp       : Option to specify number of packets in Phy Loopback test\n");
 9.  -lbh       : Option to specify number of packets in 100BT External Loopback test\n");
10.  -lbt       : Option to specify number of packets in 10BT External Loopback test\n");



Example:

> b44udiag -l test.log -c 1 -I 2 -t A3 -lbm 3000 -lbp 3000 -lbh 3000 -lbt 3000

There are 3 groups of test. Each group has a few sub tests.
Group A
A1. Indirect Control Register Test
A2. Direct Control Register Test
A3. Interrupt test
A4. Built In Self Test

Group B
B1. LEDs test
B2. EEPROM Test
B3. MII Test
B4. Link Status Test

Group C
C1. MAC Loopback Test
C2. PHY Loopback Test.
C3. External Loopback Test 100BT.
C4. External Loopback Test 10BT.


Test Descriptions
A1.  
Indirect Register Test
Command: regtest -i
Function: Each Register specified in the configuration contents read only bit and
read/write bit defines. The test writing zero and one by using indirect addressing method into the test bits to insure the read
only bits are not changed, and read/write bits are changed accordingly.
Default: Enabled

A2
Control Register Test
Command: regtest
Function: Each Register specified in the configuration contents read only bit and
read/write bit defines. The test writing zero and one into the test bits to insure the read
only bits are not changed, and read/write bits are changed accordingly.
Default: Enabled

A3	
Interrupt Test
Command: intrtest
Function: This test verifies the interrupt functionality. It enables interrupt and waits for
interrupt to occur. It waits for 500ms and reports error if could not generate interrupts.
Default: Enabled

A4
Built In Self Test
Command: bist
Function: This test will run the Built In Self Test
Default: Enabled

B1
LED Test
Command: ledtest
Function: Tests forcing of the link state for each link speed/duplex.
Default: Enabled

B2
EEPROM Test
Command: setest
Function: Reads Serial Prom and varifies integrity by checking CRC.	
Default: Enabled

B3
MII Test
Command: miitest
Function: Each Register specified in the configuration contents read only bit and
read/write bit defines. The test writing zero and one into the test bits to insure the
read only bits value are not changed, and read/write bits are changed
accordingly.
Default: Enabled

B4
Command: linkstatus
Function: Report current link status.
Default: Enabled

C1
Mac Loopback Test
Command: lbtest -m
Function: Transmits a 2000 or specified by -lbm option of 1514-byte packets with incrementing data pattern, and
checks tx and rx flags and data integrity.
Default: Enabled

C2
Phy Loopback Test
Command: lbtest -p
Function: This test is same as D1. Mac Loopback Test except, the data is routed
back via physical layer device. 
Default: Enabled

C3 
External Loopback Test 100BT
Command: lbtest -e
Function: This test is same as D1. Mac Loopback Test except, the data is routed
back via loopback device.  
Default: Disabled

C4 
External Loopback Test 10BT
Command: lbtest -a
Function: This test is same as D1. Mac Loopback Test except, the data is routed
back via loopback device.  
Default: Disabled

